| CXIDB ID 176 | |
| Deposition Summary | |
|---|---|
| Depositor: | Abraham Levitan |
| Contact: | [email protected] |
| Deposition date: | 2020-11-24 |
| Last modified: | 2020-11-24 |
| DOI: | 10.11577/1722945 |
| Publication Details | |
| Title: | Single-frame far-field diffractive imaging with randomized illumination |
| Authors: | Abraham Levitan et al. |
| Journal: | Optics Express |
| Year: | 2020 |
| DOI: | 10.1364/OE.397421 |
| Experimental Conditions | |
| Method: | Ptychography, Randomized Probe Imaging |
| Sample: | Siemens Star, Fe/Gd Multilayer |
| Wavelength: | 1.75 nm (707 eV) |
| Lightsource: | BESSY II |
| Beamline: | MAXYMUS |
Data Files
|
|
| Raw Data: | Siemens_ptycho.cxi (664.72 MB) |
| Raw Data: | Siemens_ss.cxi (558.49 KB) |
| Raw Data: | FeGd_ptycho.cxi (664.72 MB) |
| Raw Data: | FeGd_ss.cxi (558.49 KB) |
Description
Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.
